NANOTRONICS IMAGING, LLC

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
  
 
B23Q DETAILS, COMPONENTS, OR ACCESSORIES FOR MACHINE TOOLS, e.g. ARRANGEMENTS FOR COPYING OR CONTROLLING 139
 
  
 
G02B OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS 1204
 
  
 
G06K RECOGNITION OF DATA; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS 1197
 
  
 
H01L SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR 1361

Top Patents (by citation)

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Recent Publications

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Recent Patents

Patent # Title Filing Date Issue Date Intl Class
9561566 Continuously scanning XY translation stageFeb 15, 11Feb 07, 17[B23Q, H01L, G03F]
9488819 Automatic microscopic focus system and method for analysis of transparent or low contrast specimensAug 31, 12Nov 08, 16[G02B]
7991245 Increasing image resolution method employing known background and specimenMay 29, 09Aug 02, 11[H01J, G06K]

Expired/Abandoned/Withdrawn Patents

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Top Inventors for This Owner

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